Key dates

  • Early booking deadline for exhibitors:
    22 January 2016
  • Abstract poster submission deadline extended:
    23 June 2016
  • Early registration deadline:
    23 June 2016
  • Registration deadline:
    13 July 2016


Poster programme


P:01 Fast, exact, and non-destructive diagnoses in nano-scale semiconductor device using conductive AFM
Chaeho Shin, Korea Research Institute of Standards and Science, Korea


P:02 Atomic force microscopy in liquid metal
Takashi Ichii, Kyoto University, Japan


P:03 Solvent-sensitive structures of interfacial liquid on salicylic acid (110) surface
Hirotaka Honda, Kobe University, Japan


P:04 Liquid-environment FM-AFM imaging of a cobalt porphyrin
Hirotaka Honda, Kobe University, Japan


P:05 Harnessing flexural and torsional modes in multifrequency force microscopy: High resolution imaging of calcite (1014) in liquid
Tobias Meier, The George Washington University, USA


P:06 Structure determination of individual non-planar molecules by means of nc-AFM
Florian Albrecht, University of Regensburg, Germany


P:07 The effect of non-ideal tunneling current amplifiers on force measurements
Kumar Sampath, University of Regensburg, Germany


P:08 Probing the influence of point defects on local chemical reactivity and electronic properties on TiO2(110) via 3D-SPM measurements
Udo Schwarz , Yale University, USA


P:09 Surface polarization measurement on a reconstructed Si(111) surface by noncontact scanning nonlinear dielectric potentiometry
Kohei Yamasue, Tohoku University, Japan


P:10 Towards an atomic-scale understanding of metal-oxide/water interfaces
Eero Holmstrom, Aalto University, Finland

P:11 SrTiO3/H2O and TiO2/H2O solid-liquid interfaces from first-principles molecular dynamics
Eero Holmstrom, Aalto University, Finland

P:12 Magnetic force microscopy as a phase characterisation technique in stainless steels
Alexander Warren, University of Bristol, UK


P:13 Why deposition order controls the formation of a metal-organic coordination network on an insulator surface?
Ville Haapasilta, Aalto University, Finland


P:14 Sequential on-surface transformation of a hydrocarbon molecule on copper surface as observed by first-principles computations
Ville Haapasilta, Aalto University, Finland


P:15 Park Systems SmartScan TM Automised Atomic Force Microscopy for simple point and click imaging, producing expert level quality AFM images at high speed
San Joon Cho, Park Systems, Korea


P:16 Optical and morphological properties of bis-pyrenyl π-conjugated molecules in thin films adsorbed on Ionic crystal surfaces
Christian Loppacher, Aix-Marseille University / CNRS, France


P:17 Molecular-scale investigation of sulfonate-terminated alkanethiol SAMs by FM-AFM in liquid
Natsumi Inada, Kanazawa University, Japan


P:18 Building metal tips atom by atom characterized with an extended carbon monoxide front atom identification (COFI) method
Daniel Meuer, University of Regensburg, Germany


P:19 Dynamic current-distance measurements at room temperature
Sonia Matencio, University of Regensburg, Germany


P:20 High-resolution AFM/STM imaging and force spectroscopy of van der Walls nanostructures on metal surface
Pavel Jelinek, Institute of Physics of the Czech Academy of Sciences, Czech Republic


P:21 Design, material selection and construction of a high speed shear piezo scanner for mapping interfacial liquid with atomic force microscopy
Amir Farokh Payam, Durham University, UK


P:22 Three-dimensional local hydration structures on silicate minerals with various tetrahedral arrangements studied by liquid-3D-FM-AFM
Umeda Kenichi, University of Tokyo, Japan


P:23 Effect of oscillation amplitudes on bimodal FM-AFM in ambient conditions
Hiroaki Ooe, Kanazawa University, Japan


P:24 Linear distribution of Cs at surface of nano clay particle
Yuki Araki, Kyoto University, Japan


P:25 Mg concentration dependence of calcite hydration structure
Yuki Araki, Kyoto University, Japan


P:26 Influence of ions on 3D force images measured at fluorite-water interfaces
Keisuke Miyazawa, Kanazawa University, Japan


P:27 TiO2(011)-(2×1) Surface characterized by atomic force microscopy and scanning tunneling microscopy
Jo Onoda, University of Tokyo, Japan


P:28 Theoretical study of the intra- and intermolecular potentials of assemblies of C60 molecules and of phthalocyanine molecules
Mohammad Abdur Rashid, University of Nottingham, UK


P:29 Assembling molecular templates
Adam Foster, Aalto University, Finland


P:30 Development of low-latency wideband PLL for high-speed FM-AFM
Kazuki Miyata, Kanazawa University, Japan


P:31 Role of ions in solid-liquid interfaces investigated by molecular simulations
Lidija Zivanovic, Aalto University, Finland


P:32 NC-AFM imaging contrasts of the anatase TiO2 (101) surface
Thilo Glatzel, University of Basel, Switzerland


P:33 Adsorption properties of isolated porphyrin molecules on TiO2
Thilo Glatzel, University of Basel, Switzerland


P:34 Charge transfer from Pd nanoclusters into CO molecule at room temperature with AFM/KPFM
Yanjun Li, Osaka University, Japan


P:35 Comparison of the sensitivity and signal-to-noise ratio of the first two flexural modes for self-sensing qPlus AFM sensors
Dominik Kirpal, University Regensburg, Germany


P:36 Dewetting processes of thin organic films studied by noncontact and intermittent contact atomic force microscopy
Konrad Szajna, Jagiellonian University, Poland


P:37 Intermodulation AFM in UHV
Daniel Forchheimer, The Royal Institute of Technology (KTH), Sweden


P:38 Kelvin probe force microscopy of Cu(In, Ga)Se2 thin films with KF post deposition treatment
Sascha Sadewasser, International Iberian Nanotechnology, Portugal


P:39 Nc-AFM study of self-assembled triphenylamines on bulk MgO(001)
Maximilian Ammon, Friedrich-Alexander University Erlangen-Nürnberg, Germany

  P:40 Self-assembled bridged-triphenylamines on KBr(001): The role of functional groups

Sabine Maier, Friedrich-Alexander University Erlangen-Nürnberg, Germany


P:41 NC-AFM study of single silicon dangling bonds on H:Si(100) 
Taleana Huff, University of Alberta, Canada


P:42 Reconstruction of water density distributions over fluorite surfaces: How invasive are NC-AFM measurements? 
Matt Watkins, University of Lincoln, UK


P:43 One-dimensional edge state of Bi thin films studied with STM
Kawakami Naoya, University of Tokyo, Japan


P:44 Measuring the mechanical properties of molecular conformers
Samuel Jarvis, University of Nottingham, UK


P:45 Molecules within molecules: an XSW and SPM study of H2O@C60
Samuel Jarvis, University of Nottingham, UK


P:46 Simultaneous characterizations of density of states and local contact potential difference on rutile TiO2(110) by STM/KPFM
Huan Fei Wen, Osaka University, Japan


P:47 Imaging metal atoms of metal-organic coordination networks by means of nc-AFM
Fabian Queck, University of Regensburg, Germany


P:48 Capacitive distance control for quantitative magnetic force microscopy
Johannes Schwenk, EMPA, Switzerland


P:49 Organisation and ordering of 1D porphyrin polymers synthesised by on-surface Glaser coupling
Alex Saywell, University of Nottingham, UK


P:50 Different tip functionalizations in scanning probe microscopy
Philipp Scheuerer, University of Regensburg, Germany


P:51 Nanoscale characterization of LiCoO2 film by kelvin probe force microscope
Jiaxiong Wu, Beihang University, China


P:52 Development of a Universal SPM head for integration into different cryogenic environments
Andreas Bettac, Sigma Surface Science, Germany


P:53 Application of scanning Kelvin probe force microscopy to study secondary phase particles in beryllium
Simon Bacon, University of Surrey, UK


P:54 Mapping the electrostatic force field of single molecules from high-resolution scanning probe images
Nadine van der Heijden, Utrecht University, Netherlands 


P:55 Correlated fluorescence-atomic force microscopy studies of the clathrin mediated endocytosis in SKMEL Cells
Steve Smith, South Dakota School of Mines and Technology, USA


P:56 Probing PTCDA nanoisalnds with simultaneous pixel-by-pixel STS and KPFM
Katherine Cochrane, University of British Columbia, USA


P:57 Atom-resolved analysis of mica surfaces covered with a thin water layer in air by frequency modulation atomic force microscopy
Toyoko Arai, Kanazawa University, Japan


P:58 Imaging and force based atomic manipulation of Sn chains on Si(100) by NC-AFM
Adam Sweetman, University of Nottingham, UK

  P:59 Energy dissipation mechanism on layered structures

Dilek Yildiz, University of Basel, Switzerland

  P:60 Molecular adsorption studied on CaF2 thin films

Phillip Rahe, University of Nottingham, UK

  P:61 Evaluation of the twitter-ionic type modifier for anti-biofouling by using FM-AFM
Yoshiki Hirata, National Institute of Industrial Science and Technology (AIST), Japan